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Morgenstern, Markus
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1

Low-Temperature Scanning Probe Microscopy:

, In: Springer Handbook of Nanotechnology; Springer Handbooks,
Baykara, Mehmet Z. ; Morgenstern, Markus ; Schwarz, Alexander. - p. 769-808 , 2017
Link: https://doi.org/10.1007/..
 
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2

Low-Temperature Scanning Probe Microscopy:

, In: Springer Handbook of Nanotechnology,
Morgenstern, Markus ; Schwarz, Alexander ; Schwarz, Udo - p. 679-716 , 2007
Link: https://doi.org/10.1007/..
 
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3

Vermessung elektronischer Wellenfunktionen in Halbleitern: ..:

Morgenstern, Markus. (2005)  - p. 155-167
Link: http://www.digibib.tu-bs..
 
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4

Scanning Probe Microscopy on Low-Dimensional Electron Syste..:

, In: Scanning Probe Microscopy,
Morgenstern, Markus - p. 349-371 ,
Link: https://doi.org/10.1007/..
 
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5

Low-Temperature Scanning Probe Microscopy:

, In: Nanotribology and Nanomechanics,
Morgenstern, Markus ; Schwarz, Udo D. ; Schwarz, Alexander - p. 179-234 ,
Link: https://doi.org/10.1007/..
 
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6

Adaptive Isogeometric Phase-Field Modeling of Weak and Stro..:

, In: Non-standard Discretisation Methods in Solid Mechanics; Lecture Notes in Applied and Computational Mechanics,
Hennig, Paul ; Kästner, Markus ; Maier, Roland.. - p. 243-282 , 2022
Link: https://doi.org/10.1007/..
 
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7

Industrie 4.0 virtual automation bus:

, In: Proceedings of the 40th International Conference on Software Engineering: Companion Proceeedings,
Kuhn, Thomas ; Antonino, Pablo Oliveira ; Damm, Markus... - p. 121-122 , 2018
Link: https://dl.acm.org/doi/1..
 
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8

Netze und Netzelemente:

, In: Handbuch für die Telekommunikation,
Augel, Markus ; Bach, Rainer ; Dankert, Uwe... - p. 337-808 , 2002
Link: https://doi.org/10.1007/..
 
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9

List of Contributors:

, In: Stroke,
Adams Jr., Harold P. ; El Ahmadieh, Tarek Y. ; Albers, Gregory W.... - p. x-xvi , 2016
Link: https://doi.org/10.1016/..
 
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