Nahm, Abraham Y.
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Demonstration of a Stacked CMOS Inverter at 60nm Gate Pitch..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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Opportunities in 3-D stacked CMOS transistors:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Radosavljevic, M. ; Huang, C.-Y. ; Rachmady, W.... - p. 34.1.1-34.1.4 , 2021
 
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