Nanver, Lis K.
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1

Identifying nano-Schottky diode currents in silicon diodes ..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Knezevic, Tihomir ; Nanver, Lis K - p. 1-6 , 2023
 
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2

Impact of ultra-thin-layer material parameters on the suppr..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),
 
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3

Silicon-on-glass technology for RF and microwave device fab..:

, In: 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings,
Nanver, Lis K. ; de Vreede, L.C.N. ; Huang, C.... - p. None , 2006
 
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4

Checks on temperature during on-wafer I-V characterization ..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
van Zoeren, J. ; Nanver, L.K. - p. 1-6 , 2022
 
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5

Diode design for studying material defect distributions wit..:

, In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS),
Krakers, M. ; Knezevic, T. ; Batenburg, K.M... - p. 1-6 , 2020
 
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6

Reverse breakdown and light-emission patterns studied in Si..:

, In: 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO),
Krakers, Max ; Kneevic, T. ; Nanver, L. K. - p. 30-35 , 2019
 
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7

Application of laser annealing in the EU FP6 project D-DotF..:

, In: 2009 17th International Conference on Advanced Thermal Processing of Semiconductors,
Nanver, L. K. ; Jovanovic, V. ; Biasotto, C... - p. None , 2009
 
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8

50 GHz Integrated Distributed Phase Shifter Based on Novel ..:

, In: 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems,
Gentile, G. ; Buisman, K. ; Akhoukh, A.... - p. None , 2008
 
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9

"Distortion-Free" Varactor Diode Topologies for RF Adaptivi..:

, In: IEEE MTT-S International Microwave Symposium Digest, 2005.,
Buisman, K. ; de Vreede, L. C. N. ; Larson, L.E.... - p. 157-160 , 2005
 
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