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Natzke, P
1
results:
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1
Exploring the border traps near the SiO2-SiC interface usin..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Kumar, P.
;
Krummenacher, M.
;
Medeiros, H. G.
... - p. 1-6 , 2024
Link:
https://doi.org/10.1109/..
1-1
