Neff, Susan G.
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1

Leak Detection of Integrated Circuits and Other Semiconduct..:

, In: 12th International Reliability Physics Symposium,
Stanley, A. G. ; Rader, C. M. ; Neff, G. - p. None , 1974
 
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2

Esaki (tunnel)-diode logic circuits:

, In: 1960 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Neff, G. ; Butler, S. ; Critchlow, D. - p. 16,17 , 1960
 
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3

CONTRIBUTORS:

, In: Textbook of Arthoscopy,
 
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4

Racial Justice Protests Create Spaces of Hope and Healing: ..:

, In: Place, Spirituality, and Well-Being; Religion, Spirituality and Health: A Social Scientific Approach,
 
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5

Momentary Assessment of Tinnitus—How Smart Mobile Applicati..:

, In: Studies in Neuroscience, Psychology and Behavioral Economics; Digital Phenotyping and Mobile Sensing,
Schlee, Winfried ; Kraft, Robin ; Schobel, Johannes... - p. 285-303 , 2022
 
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6

Contributors:

, In: Emotion in Posttraumatic Stress Disorder,
 
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7

The Structural Competency Working Group: Lessons from Itera..:

, In: Structural Competency in Mental Health and Medicine,
Neff, Joshua ; Holmes, Seth M. ; Strong, Shirley... - p. 53-74 , 2019
 
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9

Contributor contact details:

, In: Corrosion and Conservation of Cultural Heritage Metallic Artefacts,
 
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10

Contributors:

, In: Ocular Surface Disease: Cornea, Conjunctiva and Tear Film,
 
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11

Contributors:

, In: Clinical Respiratory Medicine,
 
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12

A virtual reality system for neurobehavioral and fMRI studi..:

, In: IEEE Virtual Reality, 2003. Proceedings.,
Baumann, S. ; Neff, C. ; Fetzick, S.... - p. 312 , 2003
 
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14

Plenary Session #5 : how to hack an election:

, In: Proceedings of the 12th annual conference on Computers, freedom and privacy,
 
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15

A high repetitive, laboratory scale EUV source based on a g..:

, In: 25th Anniversary, IEEE Conference Record - Abstracts. 1998 IEEE International Conference on Plasma Science (Cat. No.98CH36221),
Bergmann, K. ; Schriever, G. ; Neff, W.. - p. 243 , 1998
 
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