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Neo, S.
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1

Application of ICP-MS for incoming chemical quality control..:

, In: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Neo, S.P. ; Yeo, W.T. ; Loh, C.W.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Contributors:

, In: Digital Manufacturing,
Accoto, Dino ; Balacheff, Boris ; Campolo, Domenico... - p. xi-xiv , 2024
Link: https://doi.org/10.1016/..
 
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3

Deposition and characterization of low-density carbon nanot..:

, In: 2022 IEEE Silicon Nanoelectronics Workshop (SNW),
Singh, Rohitkumar S. ; Takagi, K. ; Aoki, T.... - p. 1-2 , 2022
Link: https://doi.org/10.1109/..
 
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4

Watermark induced High Density Via failures in sub micron C..:

, In: 2006 IEEE International Symposium on Semiconductor Manufacturing,
Chew, Alex ; Au, H.H. ; Han, S.H.... - p. None , 2006
Link: https://doi.org/10.1109/..
 
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5

Toward Sustainable Smart Cities: A New Approach of Solar an..:

, In: Studies in Systems, Decision and Control; Artificial Intelligence and Transforming Digital Marketing,
Hashim, Nurhasliza ; Neo, Tiffiny Grace ; Mohammed, M. N.... - p. 555-563 , 2023
Link: https://doi.org/10.1007/..
 
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6

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
Link: https://doi.org/10.1109/..
 
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7

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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8

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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9

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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10

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
Link: https://doi.org/10.1109/..
 
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11

Contributors:

, In: Child Abuse and Neglect,
Broadley, Karen ; Bryce, India ; Chin, Jeffery... - p. xv-xvi , 2019
Link: https://doi.org/10.1016/..
 
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12

List of Contributors:

, In: Role of Materials Science in Food Bioengineering,
Abdullah, Muhammad ; Adaro, Mauricio O. ; Agyei, Dominic... - p. xv-xvi , 2018
Link: https://doi.org/10.1016/..
 
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13

Microbial Community Dynamics Due to Land Use Change: Some C..:

, In: Climate Change Management; Climate Change and Microbiome Dynamics,
Widyati, Enny ; Helbert ; Kusuma, Yayan Wahyu C.... - p. 51-69 , 2023
Link: https://doi.org/10.1007/..
 
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14

Contributors:

, In: Advanced Machining and Finishing,
Augustine, Shancy ; Bajpai, Vivek ; Barman, Anwesa... - p. xi-xiv , 2021
Link: https://doi.org/10.1016/..
 
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