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2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) ,
1
Experimental and simulation analysis of carrier lifetimes i..:
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2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
2
Full-Band Monte Carlo simulations of GaAs p-i-n Avalanche P..:
, In:
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2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) ,
3