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Oh, Hyunsu
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1

Investigation of Sub-20nm 4th generation DRAM cell transist..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Jeong, Shinwoo ; Lee, Jin-Seong ; Jang, Jiuk... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

14nm DRAM Development and Manufacturing:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Kim, Kanguk ; Son, Youngwoo ; Ryu, Hoin... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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3

Dielectric Breakdown Characteristics of Oil Impregnated Pre..:

, In: 2022 6th International Conference on Electric Power Equipment - Switching Technology (ICEPE-ST),
Kim, Ho-Seung ; Oh, Dong-Hun ; Song, Hyun-Su.. - p. 410-413 , 2022
Link: https://doi.org/10.1109/..
 
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4

Data Cleaning for Accurate, Fair, and Robust Models : A ..:

, In: Proceedings of the 3rd International Workshop on Data Management for End-to-End Machine Learning,
Tae, Ki Hyun ; Roh, Yuji ; Oh, Young Hun.. - p. 1-4 , 2019
Link: https://dl.acm.org/doi/1..
 
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