Ohshima, T.
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1

Soft- and Hard-Error Radiation Reliability of 228 KB $3\mat..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Takahashi, H. ; Okamoto, Y. ; Hamada, T.... - p. 1-6 , 2023
 
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2

Behavior of Damaged Sites Introduced by SEGR in Silicon Car..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Nakada, Y. ; Kuboyama, S. ; Mizuta, E.... - p. 1-4 , 2019
 
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3

EUV-FEL seeded by high-order harmonic:

, In: 2011 International Quantum Electronics Conference (IQEC) and Conference on Lasers and Electro-Optics (CLEO) Pacific Rim incorporating the Australasian Conference on Optics, Lasers and Spectroscopy and the Australian Conference on Optical Fibre Technology,
Takahashi, E. J. ; Togashi, T. ; Aoyama, M.... - p. 199-200 , 2011
 
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4

A Self-Aligned GaAs/AlGaAs Heterojunction Bipolar Transisto..:

, In: 1985 IEEE GaAs IC Symposium Technical Digest,
Ohshima, T. ; Ishii, K. ; Yokoyama, N.... - p. 053-056 , 1985
 
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5

VM/4 : ACOS-4 virtual machine architecture:

, In: Proceedings of the 12th annual international symposium on Computer architecture,
Nanba, S. ; Ohno, N. ; Kubo, H.... - p. 171-178 , 1985
 
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6

Creation of Silicon Vacancy Center in Detonation Nanodiamon..:

, In: 2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR),
 
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7

A c-axis aligned crystalline IGZO FET and a 0.06-μm2 HfO2-b..:

, In: 2022 International Electron Devices Meeting (IEDM),
Endo, M. ; Numata, S. ; Ohshima, K.... - p. 6.6.1-6.6.4 , 2022
 
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8

List of contributors:

, In: Handbook of Generation IV Nuclear Reactors,
Allibert, M. ; Aufiero, M. ; Aydogan, F.... - p. xiii-xiv , 2016
 
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9

Generation IV concepts:

, In: Handbook of Generation IV Nuclear Reactors,
Kamide, H. ; Ohshima, H. ; Sakai, T.. - p. 283-307 , 2016
 
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10

Design and fabrication of a microwave kinetic inductance de..:

, In: 2012 37th International Conference on Infrared, Millimeter, and Terahertz Waves,
Ariyoshi, S. ; Nakajima, K. ; Saito, A.... - p. 1-2 , 2012
 
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12

Key Factors in Reducing Soft Errors in Mega-Bit Drams: Funn..:

, In: 25th International Reliability Physics Symposium,
Takeda, E. ; Takeuchi, K. ; Toyabe, T... - p. None , 1987
 
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13

A full three-dimensional simulation on alpha-particle induc..:

, In: 1985 International Electron Devices Meeting,
Masuda, H. ; Toyabe, T. ; Shukuri, H... - p. 496,497,498,499 , 1985
 
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15

Facsimile shading corrector:

, In: 1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers,
Togashi, M. ; Sato, S. ; Ohshima, S... - p. 204,205 , 1984
 
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