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Orailoglu, A.
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1

A DFT approach for diagnosis and process variation-aware st..:

, In: Proceedings. 42nd Design Automation Conference, 2005.,
Topaloglu, R.O. ; Orailoglu, A. - p. 851,852,853,854,855,856 , 2005
Link: https://doi.org/10.1145/..
 
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2

Design space exploration for aggressive test cost reduction..:

, In: Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design,
Arslan, B. ; Orailoglu, A. - p. 726-731 , 2004
Link: https://dl.acm.org/doi/1..
 
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3

Frugal linear network-based test decompression for drastic ..:

, In: Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design,
Rao, Wenjing ; Orailoglu, A. ; Su, G. - p. 721-725 , 2004
Link: https://dl.acm.org/doi/1..
 
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4

Test application time and volume compression through seed o..:

, In: Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451),
Rao, W. ; Bayraktaroglu, I. ; Orailoglu, A. - p. 732,733,734,735,736,737 , 2003
Link: https://doi.org/10.1145/..
 
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5

Customizable embedded processor architectures:

, In: Euromicro Symposium on Digital System Design, 2003. Proceedings.,
Petrov, P. ; Orailoglu, A. - p. 468,469,470,471,472,473,474,475 , 2003
Link: https://doi.org/10.1109/..
 
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6

Gate Level Fault Diagnosis in Scan-Based BIST:

, In: Proceedings of the conference on Design, automation and test in Europe,
Bayraktaroglu, I. ; Orailoglu, A. - p. 376 ff. , 2002
Link: https://dl.acm.org/doi/1..
 
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7

Energy frugal tags in reprogrammable I-caches for applicati..:

, In: Proceedings of the Tenth International Symposium on Hardware/Software Codesign. CODES 2002 (IEEE Cat. No.02TH8627),
Petrov, P. ; Orailoglu, A. - p. 181,182,183,184,185,186 , 2002
Link: https://doi.org/10.1145/..
 
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8

Power Efficient Embedded Processor Ip's through Application..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Petrov, P. ; Orailoglu, A. - p. 1065 ff. , 2002
Link: https://dl.acm.org/doi/1..
 
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9

Test Planning and Design Space Exploration in a Core-Based ..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Cota, E. ; Carro, L. ; Lubaszewski, M.. - p. 478 ff. , 2002
Link: https://dl.acm.org/doi/1..
 
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10

Reducing Test Application Time Through Test Data Mutation E..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Reda, S. ; Orailoglu, A. - p. 387 ff. , 2002
Link: https://dl.acm.org/doi/1..
 
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11

Diagnosis for scan-based BIST : reaching deep into the s..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Bayraktaroglu, I. ; Orailoglu, A. - p. 102-111 , 2001
Link: https://dl.acm.org/doi/1..
 
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12

Test volume and application time reduction through scan cha..:

, In: Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232),
Bayraktaroglu, I. ; Orailoglu, A. - p. 151,152,153,154,155 , 2001
Link: https://doi.org/10.1145/..
 
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13

Towards effective embedded processors in codesigns: customi..:

, In: Ninth International Symposium on Hardware/Software Codesign. CODES 2001 (IEEE Cat. No.01TH8571),
Petrov, P. ; Orailoglu, A. - p. 79,80,81,82,83,84 , 2001
Link: https://doi.org/10.1145/..
 
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14

Speeding up control-dominated applications through microarc..:

, In: Proceedings of the 38th Design Automation Conference (IEEE Cat. No.01CH37232),
Petrov, P. ; Orailoglu, A. - p. 512,513,514,515,516,517 , 2001
Link: https://doi.org/10.1145/..
 
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15

Concurrent error recovery with near-zero latency in synthes..:

, In: Proceedings of the conference on Design, automation and test in Europe,
Hamilton, S. N. ; Orailoglu, A. - p. 604-611 , 1998
Link: https://dl.acm.org/doi/1..
 
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