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Pae, Kyong-Nam
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A Comprehensive Reliability Characterization of 5G SoC Mobi..:

, In: 2020 IEEE Symposium on VLSI Technology,
Jin, M. ; Kim, K. ; Kim, B.... - p. 1-2 , 2020
Link: https://doi.org/10.1109/..
 
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2

Reliability of Industrial grade Embedded-STT-MRAM:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ji, Y. ; Goo, H. ; Lim, J.... - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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