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Springer Proceedings in Physics; Microscopy of Semiconducting Materials 2007 ,
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Measuring Strain in Semiconductor Nanostructures by Converg..:
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2007 IEEE International Electron Devices Meeting ,
6
Fully-depleted SOI technology using high-k and single-metal..:
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2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD) ,
7