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Parent, Maxime J.
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1

Characterization and Monitoring Platform for Single-Photon ..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
Parent, Samuel ; Vachon, Frederic ; Gauthier, Valerie... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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Simulation of a Lévy process by PCA sampling to reduce the ..:

, In: Proceedings of the 40th Conference on Winter Simulation,
L'Ecuyer, Pierre ; Parent-Chartier, Jean-Sébastien ; Dion, Maxime - p. 436-443 , 2008
Link: https://dl.acm.org/doi/1..
 
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