Park, Juhyuk
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1

Impact of the channel thickness fluctuation on the subthres..:

, In: 2023 International Electron Devices Meeting (IEDM),
Jeong, Jaeyong ; Kim, Jongmin ; Lee, Jisung... - p. 1-4 , 2023
 
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2

BEOL-compatible 4F2 Single Crystalline Semiconductor Oscill..:

, In: 2023 International Electron Devices Meeting (IEDM),
 
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3

Cryogenic RF Transistors and Routing Circuits Based on 3D S..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
 
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4

Fully CMOS-Compatible Room-Temperature Waveguide-Integrated..:

, In: 2023 International Electron Devices Meeting (IEDM),
Shim, Joonsup ; Lim, Jinha ; Kim, Inki... - p. 1-4 , 2023
 
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5

Biochemical spectroscopy based on germanium-on-insulator pl..:

, In: 2022 International Electron Devices Meeting (IEDM),
Lim, Jinha ; Shim, Joonsup ; Kim, Inki... - p. 24.1.1-24.1.4 , 2022
 
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6

A Scalable Inference Pipeline for 3D Axon Tracing Algorithm:

, In: 2022 IEEE High Performance Extreme Computing Conference (HPEC),
 
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7

A sub-micron-thick InGaAs broadband (400-1700 nm) photodete..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Geum, Dae-Myeong ; Lim, Jinha ; Jang, Junho... - p. 413-414 , 2022
 
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8

Monolithic 3D sequential integration realizing 1600-PPI red..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Park, Juhyuk ; Geum, Dae-Myeong ; Baek, Woojin.. - p. 383-384 , 2022
 
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