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Pey, K. L.
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1

Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuro..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Tan, J. ; Lim, J.H. ; Kwon, J.H.... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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2

Reliability and Breakdown Study of Erase Gate Oxide in Spli..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Luo, L. ; Shubhakar, K. ; Mei, S.... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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3

A transformative engineering and architecture education:

, In: 2020 IEEE Frontiers in Education Conference (FIE),
Pey, K. L. ; Blessing, Lucienne ; Tuncer, Bige - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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4

Origins and Signatures of Tail Bit Failures in Ultrathin Mg..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lim, J. H. ; Raghavan, N. ; Kwon, J. H.... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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5

Correlation of Dielectric Breakdown and Nanoscale Adhesion ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ranjan, A. ; O'Shea, S. J. ; Bosman, M.... - p. 1-7 , 2020
Link: https://doi.org/10.1109/..
 
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6

Pulsed Laser Annealing Technology for Nano-Scale Fabricatio..:

, In: Advances in Laser Materials Processing,
Pey, K.L. ; Lee, P.S. - p. 299-337 , 2018
Link: https://doi.org/10.1016/..
 
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7

Contributors:

, In: Advances in Laser Materials Processing,
Acherjee, B. ; Ahad, I.U. ; Akinlabi, E.T.... - p. xv-xviii , 2018
Link: https://doi.org/10.1016/..
 
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8

40nm Embedded Self-Aligned Split-Gate Flash Technology for ..:

, In: 2017 IEEE International Memory Workshop (IMW),
Shum, Danny ; Luo, Lai Q. ; Kong, Y.J.... - p. 1-4 , 2017
Link: https://doi.org/10.1109/..
 
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9

List of contributors:

, In: Reliability Characterisation of Electrical and Electronic Systems,
Aitken, N. ; Al-Hashimi, B.M. ; Barnard, R.W.A.... - p. ix-x , 2015
Link: https://doi.org/10.1016/..
 
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10

Nanoscopic techniques for studying dielectric breakdown and..:

, In: 2015 IEEE International Integrated Reliability Workshop (IIRW),
Pey, K.L. - p. 159-161 , 2015
Link: https://doi.org/10.1109/..
 
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11

Reliability of emerging nanodevices:

, In: Reliability Characterisation of Electrical and Electronic Systems,
Raghavan, N. ; Pey, K.L. - p. 143-168 , 2015
Link: https://doi.org/10.1016/..
 
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