Putcha, Mohan S.
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3

Linear algebraic monoids:

, In: Positivity in Lie Theory,
Renner, Lex ; Putcha, Mohan - p. 271-282 , 1998
 
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4

ESD HBM Discharge Model in RF GaN-on-Si (MIS)HEMTs:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Wu, W.-M. ; Chen, S.-H. ; Sibaja-Hernandez, A.... - p. 39.5.1-39.5.4 , 2021
 
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From 5G to 6G: will compound semiconductors make the differ..:

, In: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT),
Collaert, N. ; Alian, A. ; Banerjee, A.... - p. 1-4 , 2020
 
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Exploring the DC reliability metrics for scaled GaN-on-Si d..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Putcha, V. ; Bury, E. ; Franco, J.... - p. 1-8 , 2020
 
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7

Fatigue Loads-Its Impact on Optomechanical Systems Consider..:

, In: Lecture Notes in Mechanical Engineering; Fatigue, Durability, and Fracture Mechanics,
 
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CMOS-compatible GaN-based devices on 200mm-Si for RF applic..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Peralagu, U. ; De Jaeger, B. ; Fleetwood, D. M.... - p. 17.2.1-17.2.4 , 2019
 
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