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Rao, S.
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1

A novel test and analysis scheme to elucidate tail bit char..:

, In: 2024 IEEE International Memory Workshop (IMW),
Kim, W. ; Pica, V. ; Jossart, N.... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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2

Noise Filtering Algorithm Based on Machine Learning for Ide..:

, In: Advances in Data-Driven Computing and Intelligent Systems; Lecture Notes in Networks and Systems,
Sadhwani, Tushar ; Pareek, Himanshu ; Harjule, Priyanka.. - p. 43-55 , 2024
Link: https://doi.org/10.1007/..
 
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3

Dielectric Stack Optimization for Die-level Warpage Reducti..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Rao, B.S.S. Chandra ; Kumar, Mishra Dileep ; Sekhar, Vasarla Nagendra... - p. 62-68 , 2024
Link: https://doi.org/10.1109/..
 
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4

Multi-Chip Stacked Memory Module Development using Chip to ..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Sekhar, Vasarla Nagendra ; Kumar, Mishra Dileep ; Tippabhotla, Sasi Kumar... - p. 2024-2030 , 2024
Link: https://doi.org/10.1109/..
 
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5

Process Challenges in Thin Wafers Fabrication with Double S..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Kumar, Mishra Dileep ; Nagendra Sekhar, Vasarla ; Rao, B.S.S. Chandra.. - p. 614-619 , 2024
Link: https://doi.org/10.1109/..
 
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6

Impact of Pulse Amplitude on Voltage-Driven Precessional Sw..:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
Favaro, D. ; Kim, W. ; Monteiro, M. Gama... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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7

Scaling the SOT track – A path towards maximizing efficienc..:

, In: 2023 International Electron Devices Meeting (IEDM),
Van Beek, S. ; Cai, K. ; Yasin, F.... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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8

Magnetic Coupling Based Test Development for Contact and In..:

, In: 2023 IEEE International Test Conference (ITC),
Yuan, S. ; Zhang, Z. ; Fieback, M.... - p. 236-245 , 2023
Link: https://doi.org/10.1109/..
 
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9

CMOS-Compatible Fine Pitch Al-Al Bonding:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Cheemalamarri, Hemanth Kumar ; Varghese, Binni ; Jaibir, Sharma... - p. 1725-1729 , 2023
Link: https://doi.org/10.1109/..
 
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10

Spacer-less Free-Layer for High-TMR Double Magnetic Tunnel ..:

, In: 2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers),
Carpenter, R. ; Rao, S. ; Monteiro, M. Gama... - p. 1-2 , 2023
Link: https://doi.org/10.1109/..
 
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11

Contributors:

, In: Atmospheric Remote Sensing,
Ali, Md. Arfan ; Arun, N. ; Bilal, Muhammad... - p. xiii-xviii , 2023
Link: https://doi.org/10.1016/..
 
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12

STT-MRAM Stochastic and Defects-aware DTCO for Last Level C..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Garcia-Redondo, F. ; Rao, S. ; Gupta, M.... - p. 97-100 , 2023
Link: https://doi.org/10.1109/..
 
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13

Study of the atmospheric and ionospheric phenomenon using G..:

, In: Atmospheric Remote Sensing,
Kumar, Sanjay ; Rao, S.S. ; Mondal, Mukulika. - p. 261-282 , 2023
Link: https://doi.org/10.1016/..
 
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14

Intelligent Demand and Supply of Electrical Vehicles:

, In: Artificial Intelligence Applications in Battery Management Systems and Routing Problems in Electric Vehicles; Advances in Computer and Electrical Engineering,
Rao, B. V. A. N. S. S. Prabhakar ; Singh, Rabindra Kumar - p. 192-208 , 2023
Link: https://doi.org/10.4018/..
 
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15

Magnetic Domain Wall Memory: A DTCO study for Memory Applic..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Gupta, M. ; Rao, S. ; Kar, G.S.. - p. 41-44 , 2023
Link: https://doi.org/10.1109/..
 
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