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Ritzenthaler, Romain
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1

The Low-Frequency Noise Behavior of Advanced Logic and Memo..:

, In: 2022 China Semiconductor Technology International Conference (CSTIC),
Simoen, Eddy ; Ritzenthaler, Romain ; Mertens, Hans... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Relevance of fin dimensions and high-pressure anneals on ho..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Chasin, Adrian ; Franco, Jacopo ; Bury, Erik... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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3

Junction technology challenges and solutions for 3D device ..:

, In: 2019 19th International Workshop on Junction Technology (IWJT),
Kikuchi, Yoshiaki ; Mertens, Hans ; Ritzenthaler, Romain... - p. 1-5 , 2019
Link: https://doi.org/10.23919..
 
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4

Impact of Device Architecture and Gate Stack Processing on ..:

, In: 2019 IEEE 13th International Conference on ASIC (ASICON),
Simoen, Eddy ; Oliveira, Alberto Vinicius ; Veloso, Anabela... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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5

Reliability in Stacked Gate-All-Around Si Nanowire Devices:..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Chasin, Adrian ; Horiguchi, Naoto ; Linten, Dimitri... - p. 1-8 , 2019
Link: https://doi.org/10.1109/..
 
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6

Hot-carrier analysis on nMOS Si FinFETs with solid source d..:

, In: 2016 IEEE International Reliability Physics Symposium (IRPS),
Chasin, Adrian ; Franco, Jacopo ; Ritzenthaler, Romain... - p. 4B-4-1-4B-4-6 , 2016
Link: https://doi.org/10.1109/..
 
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7

An explicit expression of the Lüroth invariant:

, In: Proceedings of the 38th International Symposium on Symbolic and Algebraic Computation,
Basson, Romain ; Lercier, Reynald ; Ritzenthaler, Christophe. - p. 31-36 , 2013
Link: https://dl.acm.org/doi/1..
 
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