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2022 China Semiconductor Technology International Conference (CSTIC) ,
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The Low-Frequency Noise Behavior of Advanced Logic and Memo..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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Relevance of fin dimensions and high-pressure anneals on ho..:
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2019 19th International Workshop on Junction Technology (IWJT) ,
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Junction technology challenges and solutions for 3D device ..:
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2019 IEEE 13th International Conference on ASIC (ASICON) ,
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Impact of Device Architecture and Gate Stack Processing on ..:
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2019 IEEE International Integrated Reliability Workshop (IIRW) ,
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Reliability in Stacked Gate-All-Around Si Nanowire Devices:..:
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2016 IEEE International Reliability Physics Symposium (IRPS) ,
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Hot-carrier analysis on nMOS Si FinFETs with solid source d..:
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Proceedings of the 38th International Symposium on Symbolic and Algebraic Computation ,
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