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Springer Handbook of Semiconductor Devices; Springer Handbooks ,
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Measuring Techniques for the Semiconductor's Parameters:
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2020 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
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Study of behavior of p-gate in Power GaN under positive vol..:
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2020 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
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The "first and euRopEAn siC eighT Inches pilOt liNe": a pro..:
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2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
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WInSiC4AP: Wide Band Gap Innovative SiC for Advanced Power:
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Electrical Atomic Force Microscopy for Nanoelectronics; NanoScience and Technology ,
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