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Roccaforte, Fabrizio
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1

Measuring Techniques for the Semiconductor's Parameters:

, In: Springer Handbook of Semiconductor Devices; Springer Handbooks,
Alberti, Alessandra ; Giannazzo, Filippo ; Via, Francesco La... - p. 117-168 , 2022
Link: https://doi.org/10.1007/..
 
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2

Study of behavior of p-gate in Power GaN under positive vol..:

, In: 2020 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Moschetti, Maurizio ; Miccoli, Cristina ; Fiorenza, Patrick... - p. 1-6 , 2020
Link: https://doi.org/10.23919..
 
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3

The "first and euRopEAn siC eighT Inches pilOt liNe": a pro..:

, In: 2020 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Messina, Angelo Alberto ; Imbruglia, Antonio ; Calabretta, Michele... - p. 1-6 , 2020
Link: https://doi.org/10.23919..
 
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4

WInSiC4AP: Wide Band Gap Innovative SiC for Advanced Power:

, In: 2019 AEIT International Conference of Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Imbruglia, Antonio ; Saggio, Mario ; Cascino, Salvatore... - p. 1-6 , 2019
Link: https://doi.org/10.23919..
 
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5

Conductive AFM of 2D Materials and Heterostructures for Nan..:

, In: Electrical Atomic Force Microscopy for Nanoelectronics; NanoScience and Technology,
Giannazzo, Filippo ; Greco, Giuseppe ; Roccaforte, Fabrizio.. - p. 303-350 , 2019
Link: https://doi.org/10.1007/..
 
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