Roussel, J.-M.
31  results:
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1

New backcalculation method to obtain viscoelastic propertie..:

, In: Eleventh International Conference on the Bearing Capacity of Roads, Railways and Airfields, Volume 3,
Roussel*, J.-M. ; Broutin, M. ; Di Benedetto, H.. - p. 188-197 , 2022
 
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2

THE SUVIMAX STUDY: SCIENTIFIC JUSTIFICATION AND DESIGN OF A..:

, In: Natural Antioxidants and Food Quality in Atherosclerosis and Cancer Prevention,
FAVIER, A. ; PREZIOSI, P. ; ROUSSEL, A.M.... - p. 113-122 , 1996
 
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3

The Suvimax Study: Scientific Justification and Design of a..:

, In: Natural antioxidants and food quality in atherosclerosis and cancer prevention,
Favier, A. ; Preziosi, P. ; Roussel, A.M.... - p. 113-122 ,
 
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Advancements in Video-Based Insect Tracking: A Bibliometric..:

, In: Proceedings of the 2023 7th International Conference on Advances in Image Processing,
 
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List of contributors:

, In: Instrumental Thin-Layer Chromatography,
 
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7

Recording THz pulse shapes at 88 MHz repetition rate using ..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Szwaj, C. ; Roussel, E. ; Evain, C.... - p. 1-2 , 2023
 
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Single-shot Spectrometers and Realtime THz digitizers, usin..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Roussel, E. ; Szwaj, C. ; Evain, C.... - p. 1-2 , 2023
 
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9

A New Deep Learning Method for Multispectral Image Time Ser..:

, In: ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP),
Cisse, C. T. ; Alboody, A. ; Puigt, M.... - p. 1546-1550 , 2022
 
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10

Reliability Evaluation of Semi-damascene Ru/Air-Gap interco..:

, In: 2022 IEEE International Interconnect Technology Conference (IITC),
 
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Insight to Data Retention loss in ferroelectric Hf0.5Zr0.5O..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Alam, Md Nur K. ; Higashi, Yusuke ; Truijen, B.... - p. 340-342 , 2022
 
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12

Trap-polarization interaction during low-field trap charact..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Truijen, B. ; O'Sullivan, B. ; Alam, Md Nur K.... - p. P12-1-P12-4 , 2022
 
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13

Dielectric Reliability Study of 21 nm Pitch Interconnects w..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lesniewska, A. ; Roussel, P.J. ; Tierno, D.... - p. 1-6 , 2020
 
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14

Contributors:

, In: The Neural Control of Movement,
 
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15

Physical Insights on Steep Slope FEFETs including Nucleatio..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Xiang, Y. ; Verhulst, A. S. ; Parvais, B.... - p. 21.6.1-21.6.4 , 2019
 
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