Rucker, James J.H
23  results:
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1

Copy Number Variation in Neuropsychiatric Disorders:

, In: The Oxford handbook of molecular psychology / edited by Turhan Canli
 
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2

List of Contributors:

, In: Integrating Emergency Management and Disaster Behavioral Health,
Ashwood, Albert ; Brown Jr., John J. ; Cole, Valerie L.... - p. xvii-xviii , 2017
 
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3

Contributors:

, In: Equine Dentistry,
 
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4

Contributors:

, In: Clinical Critical Care Medicine,
Adam, Sheila ; Adhikari, Neill ; Aird, William C.... - p. vii-xi , 2006
 
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5

Contributors to Volume 1:

, In: Present Knowledge in Nutrition,
 
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6

List of Contributors:

, In: Transgenic Animal Technology,
 
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7

Contributors:

, In: Avery's Diseases of the Newborn,
 
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8

Travel time estimation using NiagaraST and latte:

, In: Proceedings of the 2007 ACM SIGMOD international conference on Management of data,
Tufte, Kristin ; Li, Jin ; Maier, David... - p. 1091-1093 , 2007
 
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9

On Cold Operation of an SiGe HBT as a Broadband Low-NEP THz..:

, In: 2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz),
Grzyb, J. ; Andree, M. ; Heinemann, B... - p. 1-2 , 2023
 
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10

150 GBd PAM-4 Electrical Signal Generation using SiGe-Based..:

, In: 2022 17th European Microwave Integrated Circuits Conference (EuMIC),
Schostak, J. ; Tannert, T. ; Schmidt, C.... - p. 173-176 , 2022
 
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11

Monolithically Integrated Silicon Photodiodes For Terahertz..:

, In: 2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz),
 
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12

SiGe HBT Technology:

, In: Silicon-Germanium Heterojunction Bipolar Transistors for Mm-wave Systems Technology, Modeling and Circuit Applications,
Rücker, H. ; Heinemann, B. - p. 11-54 , 2022
 
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13

Phased Subarray of the Low-Frequency Radio Telescope GURT a..:

, In: 2020 IEEE Ukrainian Microwave Week (UkrMW),
Yerin, S. ; Konovalenko, A. ; Tokarsky, P.... - p. 1-5 , 2020
 
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14

Device Architectures for High-speed SiGe HBTs:

, In: 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS),
Rucker, H. ; Heinemann, B. - p. 1-7 , 2019
 
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15

SiGe BiCMOS Technology with 3.0 ps Gate Delay:

, In: 2007 IEEE International Electron Devices Meeting,
Rucker, H. ; Fursenko, O. ; Grabolla, T.... - p. None , 2007
 
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