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2023 IEEE Physical Assurance and Inspection of Electronics (PAINE) ,
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MeLPUF: Memory-in-Logic PUF Structures for Low-Overhead IC ..:
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2023 IEEE International Test Conference India (ITC India) ,
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Invisible Scan for Protecting Against Scan-Based Attacks: Y..:
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2023 IEEE International Test Conference India (ITC India) ,
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PROTECTS: Secure Provisioning of System-on-Chip Assets in U..:
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2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) ,
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Avatar: Reinforcing Fault Attack Countermeasures in EDA wit..:
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Proceedings of the 2020 on Great Lakes Symposium on VLSI ,
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Trust Issues in COTS: The Challenges and Emerging Solution:
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2020 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN) ,
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Depending on HTTP/2 for Privacy? Good Luck!:
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Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
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SOLOMON : an automated framework for detecting fault att..:
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2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
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SOLOMON: An Automated Framework for Detecting Fault Attack ..:
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Proceedings of the ACM SIGCOMM 2019 Conference Posters and Demos ,
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White Mirror : Leaking Sensitive Information from Intera..:
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2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) ,
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