Stroud, Charles E.
12  results:
Search for persons X
?
1

Analog and Mixed-Signal Test Architectures:

, In: System-on-Chip Test Architectures,
Foster Dai, F. ; Stroud, Charles E. - p. 703-743 , 2008
 
?
2

Field Programmable Gate Array Testing:

, In: System-on-Chip Test Architectures,
Stroud, Charles E. - p. 549-590 , 2008
 
?
3

Introduction:

, In: System-on-Chip Test Architectures,
 
?
4

A built-in self test scheme for VLSI:

, In: Proceedings of the 1995 Asia and South Pacific Design Automation Conference,
Damarla, T. Raju ; Su, Wei ; Michael, Gerald T... - p. 34-es , 1995
 
?
5

Foreword I:

, In: Architecture and Patterns for IT Service Management, Resource Planning, and Governance: Making Shoes for the Cobbler's Children,
Stroud, Robert E. - p. xv-xvii , 2011
 
?
6

An automated BIST approach for general sequential logic syn..:

, In: Proceedings of the 25th ACM/IEEE Design Automation Conference,
Stroud, C. E. - p. 3-8 , 1988
 
?
7

Noise Figure Measurement Using Mixed-Signal BIST:

, In: 2007 IEEE International Symposium on Circuits and Systems (ISCAS),
Qin, Jie ; Stroud, Charles ; Dai, Foster - p. None , 2007
 
?
8

Using embedded FPGAs for SoC yield improvement:

, In: Proceedings of the 39th annual Design Automation Conference,
 
?
9

Evaluation of FPGA resources for built-in self-test of prog..:

, In: Proceedings of the 1996 ACM fourth international symposium on Field-programmable gate arrays,
Stroud, Charles ; Chen, Ping ; Konala, Srinivasa. - p. 107-113 , 1996
 
?
 
?
12

Contributors:

, In: Berman's Pediatric Decision Making,
Abzug, Mark J. ; Albano, Edythe ; Amin, Nimisha... - p. vii-xiv , 2011
 
1-12