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Suda, Takeshi
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1

Reliability issues of gate oxides and $p-n$ junctions for v..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Narita, Tetsuo ; Kikuta, Daigo ; Ito, Kenji... - p. 1-10 , 2023
Link: https://doi.org/10.1109/..
 
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2

Interventional EUS for Pancreatic Cancer and Cholangiocarci..:

, In: Management of Pancreatic Cancer and Cholangiocarcinoma,
Matsubara, Saburo ; Nakagawa, Keito ; Suda, Kentaro... - p. 265-284 , 2021
Link: https://doi.org/10.1007/..
 
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3

List of Contributors:

, In: Nanoparticle Technology Handbook,
Abe, Hiroya ; Adschiri, Tadafumi ; Aida, Tsutomu... - p. xvii-xx , 2018
Link: https://doi.org/10.1016/..
 
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4

Influence of electrical conductivity and pH on hydrogen pro..:

, In: 2016 IEEE International Conference on Plasma Science (ICOPS),
Ihara, Takeshi ; Ide, Yusuke ; Nagata, Hideo... - p. 1-1 , 2016
Link: https://doi.org/10.1109/..
 
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5

List of Contributors:

, In: Nanoparticle Technology Handbook,
Abe, Hiroya ; Adschiri, Tadafumi ; Akatsu, Takashi... - p. ix-xii , 2012
Link: https://doi.org/10.1016/..
 
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6

List of Contributors:

, In: Nanoparticle Technology Handbook,
Abe, Hiroya ; Adschiri, Tadafumi ; Akatsu, Takashi... - p. vii-x , 2008
Link: https://doi.org/10.1016/..
 
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7

Cancellation of Static and Dynamic Power Transitions induce..:

, In: 2020 Opto-Electronics and Communications Conference (OECC),
Kawahara, Hiroki ; Sachio, Suda ; Maeda, Hideki.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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