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2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) ,
1
Practical characterization of micro fine RDL failure on PLP:
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2019 IEEE 21st Electronics Packaging Technology Conference (EPTC) ,
2
Failure detection technique for 2/2um RDL on FOPLP:
, In:
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2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) ,
3