Takagi, Noriaki
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1

Practical characterization of micro fine RDL failure on PLP:

, In: 2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC),
 
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Failure detection technique for 2/2um RDL on FOPLP:

, In: 2019 IEEE 21st Electronics Packaging Technology Conference (EPTC),
 
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Multi-scale Domain-adversarial Multiple-instance CNN for Ca..:

, In: 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR),
Hashimoto, Noriaki ; Fukushima, Daisuke ; Koga, Ryoichi... - p. 3851-3860 , 2020
 
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