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Tiong Lim, Alvin Soon
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Deep Learning-Based Silicon Wafer Defect Classification: A ..:

, In: Advances in Intelligent Manufacturing and Robotics; Lecture Notes in Networks and Systems,
Ang, Koon Hian ; Ang, Koon Meng ; Ang, Chun Kit... - p. 129-139 , 2024
Link: https://doi.org/10.1007/..
 
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A Modified African Vultures Optimization Algorithm for Enha..:

, In: Advances in Intelligent Manufacturing and Robotics; Lecture Notes in Networks and Systems,
Cheng, Wy-Liang ; Pan, Li ; Sharma, Abhishek... - p. 141-152 , 2024
Link: https://doi.org/10.1007/..
 
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