Tran, Hanh Nguyen
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1

An AI-Enhanced Process Mining Framework for Software Proces..:

, In: 2023 15th International Conference on Knowledge and Systems Engineering (KSE),
 
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3

Correction to: Monitoring Coefficient of Variation Using CU..:

, In: Springer Handbook of Engineering Statistics; Springer Handbooks,
 
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4

Land Subsidence Susceptibility Mapping Using Machine Learni..:

, In: Intelligence of Things: Technologies and Applications; Lecture Notes on Data Engineering and Communications Technologies,
 
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5

Quality Control for Smart Manufacturing in Industry 5.0:

, In: Springer Series in Reliability Engineering; Artificial Intelligence for Smart Manufacturing,
 
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6

Monitoring Coefficient of Variation Using CUSUM Control Cha..:

, In: Springer Handbook of Engineering Statistics; Springer Handbooks,
 
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7

Application of Machine Learning in Statistical Process Cont..:

, In: Springer Series in Reliability Engineering; Control Charts and Machine Learning for Anomaly Detection in Manufacturing,
 
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8

A Variable Sampling Interval EWMA Distribution-Free Control..:

, In: Proceedings of the 2018 International Conference on E-Business and Applications,
 
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9

Unveiling the Influence of Perceived Limitations: Exploring..:

, In: Advances in Information and Communication Technology; Lecture Notes in Networks and Systems,
Tuyen, Tran ; Van Hanh, Nguyen Thi - p. 448-455 , 2024
 
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10

Determination of Illegal Signs of Coal Mining Expansion in ..:

, In: Advances in Geospatial Technology in Mining and Earth Sciences; Environmental Science and Engineering,
Van Anh, Tran ; Hanh, Tran Hong ; Nga, Nguyen Quynh... - p. 225-242 , 2023
 
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11

Evaluation System for Straight Punch Training: A Preliminar..:

, In: Intelligent Systems and Networks; Lecture Notes in Networks and Systems,
 
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12

Game for upper limb rehabilitation using OpenCV:

, In: 2022 11th International Conference on Control, Automation and Information Sciences (ICCAIS),
 
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13

K-means Clustering Using R A Case Study of Market Segmentat..:

, In: Proceedings of the 2019 5th International Conference on E-Business and Applications,
 
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14

ICDAR 24: Intelligent Cross-Data Analysis and Retrieval:

, In: Proceedings of the 2024 International Conference on Multimedia Retrieval,
 
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15

Application of Deep Learning for Wafer Defect Classificatio..:

, In: Algorithms for Intelligent Systems; Proceedings of International Joint Conference on Advances in Computational Intelligence,
Hanh, Nguyen Thi Minh ; Vi, Tran Duc - p. 327-339 , 2023
 
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