Tsai, Meng-Shiun
22  results:
Search for persons X
?
1

A Novel End-to-End Ensemble UNet Network Based on Edge Comp..:

, In: Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning,
Chen, Jianwen ; Tsai, Meng-Shiun ; Lin, Wan-Ju. - p. 403-408 , 2024
 
?
2

Thermal Error Prediction of Ball Screws Based on Partial Le..:

, In: 2022 25th International Conference on Mechatronics Technology (ICMT),
 
?
3

Stylizing 3D Scene via Implicit Representation and HyperNet..:

, In: 2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
Chiang, Pei-Ze ; Tsai, Meng-Shiun ; Tseng, Hung-Yu.. - p. 215-224 , 2022
 
?
4

Self-Supervised Feature Learning from Partial Point Clouds ..:

, In: 2022 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS),
Tsai, Meng-Shiun ; Chiang, Pei-Ze ; Tsai, Yi-Hsuan. - p. 1031-1038 , 2022
 
?
5

3D Virtual-Reality Interaction System:

, In: 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW),
 
?
7

The Support of MLIR HLS Adaptor for LLVM IR:

, In: Workshop Proceedings of the 51st International Conference on Parallel Processing,
 
?
8

Patient History Summarization on Outpatient Conversation:

, In: 2022 IEEE/WIC/ACM International Joint Conference on Web Intelligence and Intelligent Agent Technology (WI-IAT),
Tsai, Hsin-Yu ; Huang, Hen-Hsen ; Chang, Che-Jui.. - p. 364-370 , 2022
 
?
9

Accelerating NNEF Framework on OpenCL Devices Using clDNN:

, In: Proceedings of the International Workshop on OpenCL,
 
?
10

Mobility Prediction at Points of Interest Using Many-to-One..:

, In: GLOBECOM 2020 - 2020 IEEE Global Communications Conference,
 
?
11

Research on Symmetrical LLC Converter Applied to DC Transfo..:

, In: 2019 IEEE 4th International Future Energy Electronics Conference (IFEEC),
 
?
12

DRC Violation Prediction with Pre-global-routing Features T..:

, In: Proceedings of the Great Lakes Symposium on VLSI 2023,
Lin, Jhen-Gang ; Chen, Yu-Guang ; Yang, Yun-Wei... - p. 313-319 , 2023
 
?
 
?
14

Wafer-level test path pattern recognition and test characte..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
 
?
15

RFIC and RF Module for 5G Applications:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Tsai, Ming-Da ; Yang, Song-Yu ; Yu, Chi-Yao... - p. 1-3 , 2020
 
1-15