Tuan, Pao-Lan
3  results:
Search for persons X
?
 
?
 
?
3

New Circuit Topology for System-Level Reliability of GaN:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Lin, Ming-Cheng ; Chang, Wen-Che ; Wu, Haw-Yun... - p. 299-302 , 2019
 
1-3