Um, In Kwon
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1

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability ..:

, In: 2022 IEEE International Reliability Physics Symposium (IRPS),
Naik, V. B. ; Lim, J. H. ; Yamane, K.... - p. 6B.3-1-6B.3-6 , 2022
 
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2

STT-MRAM Product Reliability and Cross-Talk:

, In: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Naik, V. B. ; Yamane, K. ; Kwon, J.... - p. 366-368 , 2022
 
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3

The Future of Hardware Technologies for Computing: N3XT 3D ..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Radway, R.M. ; Sethi, K. ; Chen, W.-C.... - p. 25.4.1-25.4.4 , 2021
 
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4

Magnetic Immunity Guideline for Embedded MRAM Reliability t..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Lee, T. Y. ; Yamane, K. ; Hau, L. Y.... - p. 1-4 , 2020
 
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5

Reliability of Industrial grade Embedded-STT-MRAM:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ji, Y. ; Goo, H. ; Lim, J.... - p. 1-3 , 2020
 
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6

Fast Switching of STT-MRAM to Realize High Speed Applicatio..:

, In: 2020 IEEE Symposium on VLSI Technology,
Lee, T. Y. ; Yamane, K. ; Kwon, J.... - p. 1-2 , 2020
 
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7

A Reliable TDDB Lifetime Projection Model Verified Using 40..:

, In: 2020 IEEE Symposium on VLSI Technology,
Naik, V. B. ; Yamane, K. ; Lim, J. H.... - p. 1-2 , 2020
 
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8

4.1 A 39GHz-Band CMOS 16-Channel Phased-Array Transceiver I..:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Park, H.-C. ; Kang, D. ; Lee, S. M.... - p. 76-78 , 2020
 
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9

Manufacturable 22nm FD-SOI Embedded MRAM Technology for Ind..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Naik, V. B. ; Lim, J. H. ; Lee, T. Y.... - p. 2.3.1-2.3.4 , 2019
 
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10

True 7nm Platform Technology featuring Smallest FinFET and ..:

, In: 2018 IEEE Symposium on VLSI Technology,
Jeong, W.C. ; Kwon, D.J. ; Nam, K.J.... - p. 59-60 , 2018
 
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11

The enhanced performance of a robotic arm control based on ..:

, In: IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society,
Kwon, J. ; Yang, W. ; Kim, H.... - p. 803-808 , 2016
 
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12

A 1 V 6-bit 2.4 GS/s Nyquist CMOS DAC for UWB systems:

, In: 2010 IEEE MTT-S International Microwave Symposium,
Kim, B. ; Cho, M. ; Kim, Y.. - p. 1-1 , 2010
 
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14

Turbulent Flow Simulations using the Parallelized Multigrid..:

, In: Parallel Computational Fluid Dynamics 1995,
KIM, Y ; PARK, S ; CHO, K. - p. 383-386 , 1996
 
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15

Structural Characterization of 2.5D System in Package Combi..:

, In: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC),
Lee, Byoungdo ; Choi, Jinwoo ; Lee, Sangyong... - p. 643-646 , 2024
 
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