Vinet, L.
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1

Model study of transitions in cardiac reentry dynamics foll..:

, In: Proceedings of the Second Joint 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society] [Engineering in Medicine and Biology,
Comtois, P. ; Vinet, A. - p. 1447,1448 , 2002
 
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2

Effect of coupling resistance on the entrainment of a pair ..:

, In: Proceedings of the Second Joint 24th Annual Conference and the Annual Fall Meeting of the Biomedical Engineering Society] [Engineering in Medicine and Biology,
Vinet, A. - p. 1360,1361,1362 , 2002
 
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3

An Experienced Chatbot – The Case of Technical Knowledge at..:

, In: Communications in Computer and Information Science; Artificial Intelligence. ECAI 2023 International Workshops,
 
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4

An Intelligent Chatbot Based on Hybrid Approach Implementin..:

, In: IFIP Advances in Information and Communication Technology; Artificial Intelligence for Knowledge Management, Energy and Sustainability,
 
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5

Using Micro-phenomenological Interviews To Collect And Comp..:

, In: Proceedings of the 35th Conference on l'Interaction Humain-Machine,
 
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6

Transport characterization of CMOS-based devices fabricated..:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Elbaz, G. ; Casse, M. ; Labracherie, V.... - p. 5-8 , 2023
 
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7

A Cryogenic Active Router for Qubit Array Biasing from DC t..:

, In: ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC),
Jadot, Baptiste ; Zurita, Marcos ; Billiot, Gerard... - p. 157-160 , 2023
 
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8

3D sequential integration with Si CMOS stacked on 28nm indu..:

, In: 2023 International Electron Devices Meeting (IEDM),
Mota-Frutuoso, T. ; Lapras, V. ; Brunet, L.... - p. 1-4 , 2023
 
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9

Tunnel and capacitive coupling optimization in FDSOI spin-q..:

, In: 2023 International Electron Devices Meeting (IEDM),
Bertrand, B. ; Martinez, B. ; Li, J.... - p. 1-4 , 2023
 
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10

Low-field Mobility Degradation Factors Temperature Dependen..:

, In: 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro),
 
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11

Extraction of Drain Current Variability Components in Junct..:

, In: 2023 International Conference on Noise and Fluctuations (ICNF),
 
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12

The Everyday Experience of Connectivity Limits – Insights f..:

, In: Proceedings of the 34th Conference on l'Interaction Humain-Machine,
 
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13

Electrical characterization and modeling of FDSOI MOSFETs f..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),
 
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14

Experimental Comparison of Junctionless and Inversion-Mode ..:

, In: 2022 36th Symposium on Microelectronics Technology (SBMICRO),
 
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15

Specificities of linear Si QD arrays integration and charac..:

, In: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Niebojewski, H. ; Bertrand, B. ; Nowak, E.... - p. 415-416 , 2022
 
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