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Wang, Sheldon
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1

Overseas development for a major U.S. eCommerce website:

, In: Proceedings of the 28th international conference on Software engineering,
Wu, Jiang ; Wang, Sheldon ; Chau, Christine.. - p. 632-635 , 2006
Link: https://dl.acm.org/doi/1..
 
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2

Contributors:

, In: Biomechanics of Coronary Atherosclerotic Plaque,
Akyildiz, Ali C. ; Antoniadis, Antonios P. ; Athanasiou, Lambros S.... - p. xix-xxiv , 2021
Link: https://doi.org/10.1016/..
 
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3

List of Contributors:

, In: Chronic Renal Disease,
Abramovitz, Blaise ; Adu, Dwomoa ; Afshinnia, Farsad... - p. xiii-xvii , 2020
Link: https://doi.org/10.1016/..
 
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4

EM Assessment for Power Grid Networks:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 153-175 , 2019
Link: https://doi.org/10.1007/..
 
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5

Dynamic EM Models for Transient Stress Evolution and Recove..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 97-120 , 2019
Link: https://doi.org/10.1007/..
 
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6

ExtraTime: Modeling and Analysis of Transistor Aging at Mic..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 415-438 , 2019
Link: https://doi.org/10.1007/..
 
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7

Aging Effects in Sequential Elements:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 343-356 , 2019
Link: https://doi.org/10.1007/..
 
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8

Introduction:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 3-12 , 2019
Link: https://doi.org/10.1007/..
 
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9

Fast EM Immortality Analysis for Multi-Segment Copper Inter..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 67-96 , 2019
Link: https://doi.org/10.1007/..
 
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10

Aging Relaxation at Microarchitecture Level Using Special N..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 401-414 , 2019
Link: https://doi.org/10.1007/..
 
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11

Workload-Aware Static Aging Monitoring and Mitigation of Ti..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 373-399 , 2019
Link: https://doi.org/10.1007/..
 
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12

Learning-Based DRM and Energy Optimization for Manycore Dar..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 217-245 , 2019
Link: https://doi.org/10.1007/..
 
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13

Introduction:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 279-304 , 2019
Link: https://doi.org/10.1007/..
 
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14

Recovery-Aware DRM for Near-Threshold Dark Silicon Processo..:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 247-262 , 2019
Link: https://doi.org/10.1007/..
 
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15

Compact EM Models for Multi-Segment Interconnect Wires:

, In: Long-Term Reliability of Nanometer VLSI Systems,
Tan, Sheldon ; Tahoori, Mehdi ; Kim, Taeyoung... - p. 121-151 , 2019
Link: https://doi.org/10.1007/..
 
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