Watanabe, Takeo
26  results:
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2

Lithography:

, In: 2021 IEEE International Roadmap for Devices and Systems Outbriefs,
 
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Contributors:

, In: fMRI Neurofeedback,
 
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4

[Keynote] Current status and prospect for EUV lithography:

, In: 2017 7th International Conference on Integrated Circuits, Design, and Verification (ICDV),
Watanabe, Takeo - p. 1-1 , 2017
 
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5

Exposure-Based Perceptual Learning:

, In: Encyclopedia of the Sciences of Learning,
Choi, Hoon ; Watanabe, Takeo - p. 1249-1251 , 2012
 
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Optimization of photo acid generator in the PAG-bonded resi..:

, In: 2007 Digest of papers Microprocesses and Nanotechnology,
 
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Microscopic Modeling of MgO Barrier Degradation Due to Inte..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Takashima, Rina ; Koike, Takeo ; Itai, Shogo... - p. P10.EM-1-P10.EM-5 , 2024
 
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Low-Complexity Digital Predistortion of RF Power Amplifiers..:

, In: 2023 IEEE 98th Vehicular Technology Conference (VTC2023-Fall),
 
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Achievements of the ALOS-2 L-Band SAR Long-Term Pantropical..:

, In: IGARSS 2023 - 2023 IEEE International Geoscience and Remote Sensing Symposium,
 
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Basic Performance Evaluation of Low Latency and High Capaci..:

, In: 2023 IEEE Wireless Communications and Networking Conference (WCNC),
 
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11

Digital Predistortion of RF Power Amplifiers using DeepShif:

, In: 2023 IEEE Wireless Communications and Networking Conference (WCNC),
 
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12

Advancements in Global Forest Monitoring Research Founded o..:

, In: IGARSS 2022 - 2022 IEEE International Geoscience and Remote Sensing Symposium,
 
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Observing How Influence of Nature Phenomena Against Inside ..:

, In: Sustainable Civil Infrastructures; Advances in Road Infrastructure and Mobility,
 
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Substrate Bias Effect on SOI-based Thermoelectric Power Gen..:

, In: 2021 17th International Conference on Quality in Research (QIR): International Symposium on Electrical and Computer Engineering,
Inokawa, Hiroshi ; Goi, Yuto ; Yorigami, Toshiaki... - p. 119-122 , 2021
 
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4-4 Effect of Unit-cell Arrangement on Performance of Multi..:

, In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Abe, Katsuki ; Oda, Kaito ; Tomita, Motohiro... - p. 75-78 , 2020
 
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