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Woo, Seunghee
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Automatic prediction of MOSFETs threshold voltage by machin..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Choi, Seoyeon ; Park, Dong Geun ; Kim, Min Jung... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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A Novel Simulation Methodology Reflecting System Power Scen..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
Na, Woo-Jin ; Joo, Kun ; Sung, Rak-Joo... - p. 929-936 , 2022
Link: https://doi.org/10.1109/..
 
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