Wu, Jun-Tsung
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1

Pattern Generation for Efficient Acceptability Verification..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
 
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2

On No-Reference Error Detection of an Image Stitching Syste..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Hsieh, Tong-Yu ; Tsui, Pao-Wei ; Wu, Jun-Tsung - p. 150-155 , 2022
 
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3

On Enhancing Error-Tolerability of Videos via Re-Encoding w..:

, In: 2020 IEEE International Test Conference in Asia (ITC-Asia),
 
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4

A Hybrid Buck Converter Stacked on Auxiliary-switched-capac..:

, In: ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC),
Wu, Tzu-Ying ; Shi-Jun, Zeng ; Wang, Tz-Wun... - p. 429-432 , 2023
 
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5

A Single-Inductor Triple-Output Buck-Boost Converter with O..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Hsu, Zhi-Yun ; Liu, Chi-Wei ; Wu, Jun-Wan... - p. 3575-3578 , 2022
 
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7

The Constraint Artificial-Intelligence Assisted Method for ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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8

Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Usi..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Wu, Yu-Tsung ; Liang, Zhe-Jia ; Hsieh, Chao-Ho... - p. 1-4 , 2024
 
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9

A Profiling Guided Optimization Scheme for Accelerating Qua..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Wu, Yu-Tsung ; Huang, Po-Hsuan ; Tu, Chia-Heng. - p. 497-498 , 2023
 
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10

High-Speed, Low-Storage Power and Thermal Predictions for A..:

, In: 2023 IEEE International Test Conference (ITC),
Liang, Zhe-Jia ; Wu, Yu-Tsung ; Yang, Yun-Feng... - p. 206-215 , 2023
 
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11

Low-IR-Drop Test Pattern Regeneration Using A Fast Predicto:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Liu, Shi-Tang ; Chen, Jia-Xian ; Wu, Yu-Tsung... - p. 27-32 , 2022
 
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12

Vector-based Dynamic IR-drop Prediction Using Machine Learn..:

, In: 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC),
Chen, Jia-Xian ; Liu, Shi-Tang ; Wu, Yu-Tsung... - p. 202-207 , 2022
 
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13

Study of Plasma Ash Rate Enhancement by Machine Learning Mo..:

, In: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Jheng, Shao-Lou ; Wu, Jyunhong ; Yang, Zusing... - p. 1-4 , 2021
 
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14

Physical Model for Rapid Thermal Annealing (RTA) Induced Me..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
 
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15

Impact of Asymmetric Memory Hole Profile on Silicon Selecti..:

, In: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
 
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