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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
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Pattern Generation for Efficient Acceptability Verification..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
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On No-Reference Error Detection of an Image Stitching Syste..:
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2020 IEEE International Test Conference in Asia (ITC-Asia) ,
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On Enhancing Error-Tolerability of Videos via Re-Encoding w..:
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ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC) ,
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A Hybrid Buck Converter Stacked on Auxiliary-switched-capac..:
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2022 IEEE International Symposium on Circuits and Systems (ISCAS) ,
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A Single-Inductor Triple-Output Buck-Boost Converter with O..:
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2020 IEEE Symposium on VLSI Circuits ,
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A 22nm 96KX144 RRAM Macro with a Self-Tracking Reference an..:
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2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
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The Constraint Artificial-Intelligence Assisted Method for ..:
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2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA) ,
8
Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Usi..:
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2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan) ,
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A Profiling Guided Optimization Scheme for Accelerating Qua..:
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2023 IEEE International Test Conference (ITC) ,
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High-Speed, Low-Storage Power and Thermal Predictions for A..:
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2022 23rd International Symposium on Quality Electronic Design (ISQED) ,
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Low-IR-Drop Test Pattern Regeneration Using A Fast Predicto:
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2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC) ,
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Vector-based Dynamic IR-drop Prediction Using Machine Learn..:
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2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
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Study of Plasma Ash Rate Enhancement by Machine Learning Mo..:
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2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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Physical Model for Rapid Thermal Annealing (RTA) Induced Me..:
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2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) ,
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