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Wu, Ren-Tsung
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1

Real time process monitoring using diffraction-based overla..:

, In: 2020 International Workshop on Advanced Patterning Solutions (IWAPS),
Chen, Henry ; Chang, Jimmy ; Tsao, Sheng-Tsung... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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2

Comparisons of Performance and Reliability in 4H-SiC Tri-ga..:

, In: 2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia),
Hu, Jia-Wei ; Lu, Tsung-Yuan ; Kang, Kuan-Min... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

A 28nm Nonvolatile AI Edge Processor using 4Mb Analog-Based..:

, In: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits),
Wen, Tai-Hao ; Hung, Je-Min ; Hsu, Hung-Hsi... - p. 1-2 , 2023
Link: https://doi.org/10.23919..
 
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4

A 22nm 4Mb STT-MRAM Data-Encrypted Near-Memory Computation ..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Chiu, Yen-Cheng ; Yang, Chia-Sheng ; Teng, Shih-Hsin... - p. 178-180 , 2022
Link: https://doi.org/10.1109/..
 
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5

Metalens for light field imaging:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),
Chu, Cheng Hung ; Chen, Mu Ku ; Kuo, Hsin Yu... - p. 1-1 , 2019
Link: https://doi.org/10.1364/..
 
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6

Pattern Generation for Efficient Acceptability Verification..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Chao, Wei-Ji ; Kourfali, Alexandra ; Lylina, Natalia... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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7

The Constraint Artificial-Intelligence Assisted Method for ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Yang, Zusing ; Liang, Ying-Hung ; Tsai, Cheng-En... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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8

Dynamic IR-Drop Prediction of At-Speed Two-Vector Tests Usi..:

, In: 2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA),
Wu, Yu-Tsung ; Liang, Zhe-Jia ; Hsieh, Chao-Ho... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
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9

A Profiling Guided Optimization Scheme for Accelerating Qua..:

, In: 2023 International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan),
Wu, Yu-Tsung ; Huang, Po-Hsuan ; Tu, Chia-Heng. - p. 497-498 , 2023
Link: https://doi.org/10.1109/..
 
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10

High-Speed, Low-Storage Power and Thermal Predictions for A..:

, In: 2023 IEEE International Test Conference (ITC),
Liang, Zhe-Jia ; Wu, Yu-Tsung ; Yang, Yun-Feng... - p. 206-215 , 2023
Link: https://doi.org/10.1109/..
 
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11

Low-IR-Drop Test Pattern Regeneration Using A Fast Predicto:

, In: 2022 23rd International Symposium on Quality Electronic Design (ISQED),
Liu, Shi-Tang ; Chen, Jia-Xian ; Wu, Yu-Tsung... - p. 27-32 , 2022
Link: https://doi.org/10.1109/..
 
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12

Vector-based Dynamic IR-drop Prediction Using Machine Learn..:

, In: 2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC),
Chen, Jia-Xian ; Liu, Shi-Tang ; Wu, Yu-Tsung... - p. 202-207 , 2022
Link: https://doi.org/10.1109/..
 
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13

On No-Reference Error Detection of an Image Stitching Syste..:

, In: 2022 IEEE 31st Asian Test Symposium (ATS),
Hsieh, Tong-Yu ; Tsui, Pao-Wei ; Wu, Jun-Tsung - p. 150-155 , 2022
Link: https://doi.org/10.1109/..
 
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14

Study of Plasma Ash Rate Enhancement by Machine Learning Mo..:

, In: 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Jheng, Shao-Lou ; Wu, Jyunhong ; Yang, Zusing... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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15

Physical Model for Rapid Thermal Annealing (RTA) Induced Me..:

, In: 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Lin, Tingyou ; Lee, Jian-Hsing ; Wu, Cheng-Tsung... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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