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2023 IEEE International Conference on Data Mining (ICDM) ,
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Context Sketching for Memory-efficient Graph Representation..:
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Proceedings of the 9th ACM International Conference on Nanoscale Computing and Communication ,
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An opportunistic routing strategy for circulation flow-guid..:
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2019 IEEE/CVF International Conference on Computer Vision (ICCV) ,
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Beyond Human Parts: Dual Part-Aligned Representations for P..:
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2021 IEEE Far East NDT New Technology & Application Forum (FENDT) ,
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Dynamic Detection of Wheel Tread Crack Based on Eddy Curren..:
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2021 IEEE Far East NDT New Technology & Application Forum (FENDT) ,
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Detection of closed cracks on the rail surface in thermogra..:
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Proceedings of the International Conference on Computing, Machine Learning and Data Science ,
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Photovoltaic Array Extraction Algorithm Based on Modified U..:
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2023 8th IEEE International Conference on Network Intelligence and Digital Content (IC-NIDC) ,
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Discrimination of Deepwater Drilling Overflow Based on EDF-..:
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2023 4th International Conference on Computer, Big Data and Artificial Intelligence (ICCBD+AI) ,
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Feature Memory and Deep Cross Network for Parameter Predict..:
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2022 Asian Conference on Frontiers of Power and Energy (ACFPE) ,
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Application of CSGE-PSPnet Remote Sensing Image Semantic Se..:
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Proceedings of the 2024 7th International Conference on Machine Vision and Applications ,
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Improving Optical Character Recognition in License Plate Im..:
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IGARSS 2023 - 2023 IEEE International Geoscience and Remote Sensing Symposium ,
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Application of Sentinel-1 and DEM Data to Shoreline Detecti..:
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2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS) ,
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MicroKGCL: A Knowledge Graph for Root Cause Localization of..:
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Proceedings of the 2022 International Symposium on Physical Design ,
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Intelligent Design Automation for Heterogeneous Integration:
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2022 23rd International Symposium on Quality Electronic Design (ISQED) ,
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Path-Based Pre-Routing Timing Prediction for Modern Very La..:
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2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) ,
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