Yen, Shih-chien
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1

Improving Robustness of CNN on Noisy Labels with Hinge Loss..:

, In: 2023 15th International Conference on Intelligent Human-Machine Systems and Cybernetics (IHMSC),
Gao, Fengyu ; Chen, Chien-Hua ; Zhang, Hong. - p. 32-35 , 2023
 
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2

An overview of XAI Algorithms:

, In: 2023 International Automatic Control Conference (CACS),
Chen, Yen-Wei ; Chien, Shih-Yi ; Yu, Fang - p. 1-5 , 2023
 
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3

Optical properties of InN-based photodetection devices:

, In: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC),
 
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4

Investigation of Moisture-Induced Warpage of Chip-on-Wafer ..:

, In: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC),
 
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5

Analysis of Neutral Line Current Ripple Effective Value for..:

, In: 2023 IEEE International Future Energy Electronics Conference (IFEEC),
Shih, Chien-Heng ; Li, Wen-Yen ; Chen, Yaow-Ming - p. 532-537 , 2023
 
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6

The Three-phase Four-Wire Grid-type Inverter Neutral line C..:

, In: 2023 IEEE International Future Energy Electronics Conference (IFEEC),
 
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7

ZnO Nanorods Morphology Control in Hydrothermal Method and ..:

, In: 2023 IEEE 23rd International Conference on Nanotechnology (NANO),
Liao, Che-Hao ; Huang, Tai-Chin ; Yen, Zhong-Hong... - p. 866-871 , 2023
 
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8

Malignant Neoplasms of the Small Intestines:

, In: Atlas of Small Intestinal Disorders,
Hu, Ming-Luen ; Chiu, Yi-Chun ; Tai, Wei-Chen... - p. 19-45 , 2023
 
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9

Appling Artificial Intelligence Techniques on Singing Teach..:

, In: Proceedings of the 28th ACM Symposium on Virtual Reality Software and Technology,
 
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10

A 22nm 4Mb STT-MRAM Data-Encrypted Near-Memory Computation ..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
Chiu, Yen-Cheng ; Yang, Chia-Sheng ; Teng, Shih-Hsin... - p. 178-180 , 2022
 
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11

The Relationship between Product Life Cycles and Sales Pers..:

, In: Proceedings of the 4th International Conference on Industrial and Business Engineering,
Chen, Chun-Yen ; Fan, Shih-Hsun ; Chien, Yuan-Yu - p. 152-157 , 2018
 
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12

A probabilistic analysis method for functional qualificatio..:

, In: Proceedings of the Conference on Design, Automation and Test in Europe,
Lin, Hsiu-Yi ; Wang, Chun-Yao ; Chang, Shih-Chieh... - p. 147-152 , 2012
 
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13

III–V MOSFETs with a new self-aligned contact:

, In: 2010 Symposium on VLSI Technology,
Zhang, Xingui ; Guo, Huaxin ; Ko, Chih-Hsin... - p. 233-234 , 2010
 
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14

Consumer adoption of e-service: integrating technology read..:

, In: A Unifying Discipline for Melting the Boundaries Technology Management:,
Chien-Hsin Lin ; Hsin-Yu Shih ; Sher, P.J.. - p. 483,484,485,486,487,488 , 2005
 
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15

Simulation of Solder Crack Phenomenon in Molding Process:

, In: 2023 IEEE 73rd Electronic Components and Technology Conference (ECTC),
Chien, Tzu Chieh ; Li, Zong Yuan ; Lo, Shih Kun... - p. 1959-1963 , 2023
 
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