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Yim, Kyung-Gyu
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1

A 140 dB Single-Exposure Dynamic-Range CMOS Image Sensor wi..:

, In: 2022 International Electron Devices Meeting (IEDM),
Oh, Youngsun ; Lim, Jungwook ; Park, Soeun... - p. 37.7.1-37.7.4 , 2022
Link: https://doi.org/10.1109/..
 
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2

Modeling Static Cutting Forces And Stresses in the Face Mil..:

, In: 2020 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS),
Kyung, Richard ; Yim, Jesang - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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3

Breakthrough of selector technology for cross-point 25-nm R..:

, In: 2017 IEEE International Electron Devices Meeting (IEDM),
Kim, Soo Gil ; Hwang, Hyun Mi ; Lee, Bo Mi... - p. 2.1.1-2.1.4 , 2017
Link: https://doi.org/10.1109/..
 
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4

A floorplan-based planning methodology for power and clock ..:

, In: Proceedings of the 36th annual ACM/IEEE Design Automation Conference,
Yim, Joon-Seo ; Bae, Seong-Ok ; Kyung, Chong-Min - p. 766-771 , 1999
Link: https://dl.acm.org/doi/1..
 
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5

Reducing cross-coupling among interconnect wires in deep-su..:

, In: Proceedings of the 36th annual ACM/IEEE Design Automation Conference,
Yim, Joon-Seo ; Kyung, Chong-Min - p. 485-490 , 1999
Link: https://dl.acm.org/doi/1..
 
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6

A C-based RTL design verification methodology for complex m..:

, In: Proceedings of the 34th annual Design Automation Conference,
Yim, Joon-Seo ; Hwang, Yoon-Ho ; Park, Chang-Jae... - p. 83-88 , 1997
Link: https://dl.acm.org/doi/1..
 
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