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2022 International Electron Devices Meeting (IEDM) ,
1
A 140 dB Single-Exposure Dynamic-Range CMOS Image Sensor wi..:
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2020 IEEE International IOT, Electronics and Mechatronics Conference (IEMTRONICS) ,
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Modeling Static Cutting Forces And Stresses in the Face Mil..:
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2017 IEEE International Electron Devices Meeting (IEDM) ,
3
Breakthrough of selector technology for cross-point 25-nm R..:
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Proceedings of the 36th annual ACM/IEEE Design Automation Conference ,
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A floorplan-based planning methodology for power and clock ..:
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Proceedings of the 36th annual ACM/IEEE Design Automation Conference ,
5
Reducing cross-coupling among interconnect wires in deep-su..:
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Proceedings of the 34th annual Design Automation Conference ,
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