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Yoon, Ui Seoung
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1

Early Diagnosis and Prediction of Wafer Quality Using Machi..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Ko, Heung-Kook ; Park, Sena ; Ryu, Jihyun... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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Designing System Model to Detect Malfunction of Gas Sensor ..:

, In: Computational Science/Intelligence & Applied Informatics; Studies in Computational Intelligence,
Yoon, Ki-Su ; Lee, Seoung-Hyeon ; Lee, Jae-Pil. - p. 123-133 , 2018
Link: https://doi.org/10.1007/..
 
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