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Yoshimura, Daisuke
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1

High-Endurance FeFET with Metal-Doped Interfacial Layer for..:

, In: 2023 International Electron Devices Meeting (IEDM),
Suzuki, Kunifumi ; Sakuma, Kiwamu ; Yoshimura, Yoko... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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2

Malicious Attacks on Electronic Systems and VLSIs for Secur..:

, In: VLSI Design and Test for Systems Dependability,
Fujino, Takeshi ; Suzuki, Daisuke ; Hori, Yohei... - p. 395-437 , 2018
Link: https://doi.org/10.1007/..
 
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3

INVISIBLE : the shadow chaser:

, In: ACM SIGGRAPH 2006 Emerging technologies,
Nakano, Yoshinobu ; Ouwa, Haruka ; Kawashima, Kenji... - p. 19-es , 2006
Link: https://dl.acm.org/doi/1..
 
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4

ID CAM : A Smart Camera for Scene Capturing and ID Recog..:

, In: Proceedings of the 2nd IEEE/ACM International Symposium on Mixed and Augmented Reality,
Matsushita, Nobuyuki ; Hihara, Daisuke ; Ushiro, Teruyuki... - p. 227 ff. , 2003
Link: https://dl.acm.org/doi/1..
 
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