Youn, Yeo-Chang
16  results:
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1

The Effect of the Ratio of Remanent Flux Density to Coerciv..:

, In: 2023 11th International Conference on Power Electronics and ECCE Asia (ICPE 2023 - ECCE Asia),
Choi, Minyeong ; Hong, Yang-Ki ; Won, Hoyun... - p. 39-44 , 2023
 
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2

Simulation of Rough Electrodes Coupled with Structural Dyna..:

, In: 2023 IEEE 68th Holm Conference on Electrical Contacts (HOLM),
 
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3

NTIRE 2023 Image Shadow Removal Challenge Report:

, In: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW),
 
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4

ISAR imaging of helicopter:

, In: 2007 IEEE International Geoscience and Remote Sensing Symposium,
Chang Zheng Ma ; Tat Soon Yeo ; Hwee Siang Tan... - p. None , 2007
 
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5

E learning Participation Intention Among Tertiary Students ..:

, In: 2023 International Conference on Digital Applications, Transformation & Economy (ICDATE),
 
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6

Thermal Performance Analysis of Phase Change Material/Bioch..:

, In: Proceedings of the 5th International Conference on Building Energy and Environment; Environmental Science and Engineering,
Park, Jinyoung ; Yeo, Su-Hwan ; Park, Haedeun. - p. 733-736 , 2023
 
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7

A 64Mpixel CMOS Image Sensor with 0.56μm Unit Pixels Separa..:

, In: 2022 IEEE International Solid- State Circuits Conference (ISSCC),
 
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8

Effects of interface interactivity on collecting language d..:

, In: Proceedings of the Second International Symposium of Chinese CHI,
Wang, Hao-Chuan ; Yeo, Tau-Heng ; Lee, Hsin-Hui... - p. 93-96 , 2014
 
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9

Contributor contact details:

, In: Microfluidic Devices for Biomedical Applications,
Li, XiuJun (James) ; Zhou, Yu ; Wu, Wen-I... - p. xii-xv , 2013
 
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10

III–V MOSFETs with a new self-aligned contact:

, In: 2010 Symposium on VLSI Technology,
Zhang, Xingui ; Guo, Huaxin ; Ko, Chih-Hsin... - p. 233-234 , 2010
 
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11

PLCStudio : simulation based PLC code verification:

, In: Proceedings of the 40th Conference on Winter Simulation,
Park, Sang C. ; Park, Chang Mok ; Wang, Gi-Nam.. - p. 222-228 , 2008
 
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12

A 3nm CMOS FinFlex™ Platform Technology with Enhanced Power..:

, In: 2022 International Electron Devices Meeting (IEDM),
Wu, Shien-Yang ; Chang, C.H. ; Chiang, M.C.... - p. 27.5.1-27.5.4 , 2022
 
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13

Critical Process Features Enabling Aggressive Contacted Gat..:

, In: 2022 International Electron Devices Meeting (IEDM),
Chang, Chih-Hao ; Chang, V.S. ; Pan, K.H.... - p. 27.1.1-27.1.4 , 2022
 
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14

Contributors:

, In: Microfluidic Devices for Biomedical Applications,
Abdallah, B.G. ; Ali, M.M. ; Benhabib, Merwan... - p. xi-xiv , 2021
 
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15

5nm CMOS Production Technology Platform featuring full-fled..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Yeap, Geoffrey ; Chen, X. ; Yang, B. R.... - p. 36.7.1-36.7.4 , 2019
 
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