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Young, Barnaby Edward
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1

Single Event Upset and Total Ionizing Dose Response of 12LP..:

, In: 2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC),
Neuendank, Jereme ; Spear, Matthew ; Wallace, Trace... - p. 1-9 , 2022
Link: https://doi.org/10.1109/..
 
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2

Implementation of an all-digital electrostatic micro-mirror..:

, In: 2023 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP),
Portelli, Barnaby ; Grech, Ivan ; Micallef, Joseph... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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3

An out-of-plane FR4-MEMS Scanning Grating for NIR Spectrome..:

, In: 2022 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP),
Farrugia, Russell ; Portelli, Barnaby ; Grech, Ivan... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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4

Resonant micro-mirror electrical characterisation towards t..:

, In: 2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Portelli, Barnaby ; Grech, Ivan ; Micallef, Joseph... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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5

Resonant micro-mirror oscillation amplitude measurement and..:

, In: 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP),
Portelli, Barnaby ; Grech, Ivan ; Micallef, Joseph... - p. 1-4 , 2020
Link: https://doi.org/10.1109/..
 
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6

Design and Fabrication of High Performance Resonant Micro-M..:

, In: 2020 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP),
Farrugia, Russell ; Portelli, Barnaby ; Grech, Ivan... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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7

On-Chip Characterization of Random Telegraph Signal Noise i..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Kim, J. ; Loveless, T. D. ; Pew, J.... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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8

Modeling Neutron Radiation Damage in Bipolar Junction Trans..:

, In: 2023 IEEE International Conference on Plasma Science (ICOPS),
Banerjee, S. ; Ho, L.T.T. ; Gao, X.... - p. 1-1 , 2023
Link: https://doi.org/10.1109/..
 
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9

Self-correcting Flip-flops for Triple Modular Redundant Log..:

, In: 2022 IEEE International Symposium on Circuits and Systems (ISCAS),
Clark, Lawrence T. ; Duvnjak, Alen ; Young-Sciortino, Clifford... - p. 1205-1209 , 2022
Link: https://doi.org/10.1109/..
 
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10

List of Contributors:

, In: Pharmacognosy,
Abas, F. ; Al-Dhabi, N.A. ; Amarakoon, I.I.... - p. xvii-xviii , 2017
Link: https://doi.org/10.1016/..
 
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