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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
On-Chip Characterization of Random Telegraph Signal Noise i..:
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2020 IEEE International Conference on Plasma Science (ICOPS) ,
4
Development of a Plasma Experiment and Microwave Sources fo..:
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2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) ,
9
Electrical stability impact of gate oxide in channel implan..:
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Reference Module in Materials Science and Materials Engineering ,
10
Wood Degradation Studies from Thermal to Chemical:
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2nd Annual Passive RF and Microwave Components Seminar ,
15