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Yu-Shiun Tsai
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1

Stylizing 3D Scene via Implicit Representation and HyperNet..:

, In: 2022 IEEE/CVF Winter Conference on Applications of Computer Vision (WACV),
Chiang, Pei-Ze ; Tsai, Meng-Shiun ; Tseng, Hung-Yu.. - p. 215-224 , 2022
Link: https://doi.org/10.1109/..
 
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2

Thermal Error Prediction of Ball Screws Based on Partial Le..:

, In: 2022 25th International Conference on Mechatronics Technology (ICMT),
Hung, Chien-Hsiang ; Tsai, Meng-Shiun ; Hong, Mao-Qi.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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3

Patient History Summarization on Outpatient Conversation:

, In: 2022 IEEE/WIC/ACM International Joint Conference on Web Intelligence and Intelligent Agent Technology (WI-IAT),
Tsai, Hsin-Yu ; Huang, Hen-Hsen ; Chang, Che-Jui.. - p. 364-370 , 2022
Link: https://doi.org/10.1109/..
 
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4

3D Virtual-Reality Interaction System:

, In: 2019 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-TW),
Huang, Xin-Yu ; Tsai, Meng-Shiun ; Huang, Ching-Chun - p. 1-2 , 2019
Link: https://doi.org/10.1109/..
 
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5

DRC Violation Prediction with Pre-global-routing Features T..:

, In: Proceedings of the Great Lakes Symposium on VLSI 2023,
Lin, Jhen-Gang ; Chen, Yu-Guang ; Yang, Yun-Wei... - p. 313-319 , 2023
Link: https://dl.acm.org/doi/1..
 
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6

Wafer Defect Pattern Classification with Explainable-Decisi..:

, In: 2022 IEEE International Test Conference (ITC),
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Wang, Sying-Jyan... - p. 549-553 , 2022
Link: https://doi.org/10.1109/..
 
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7

RFIC and RF Module for 5G Applications:

, In: 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Tsai, Ming-Da ; Yang, Song-Yu ; Yu, Chi-Yao... - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
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8

10.3 A 12nm CMOS RF Transceiver Supporting 4G/5G UL MIMO:

, In: 2020 IEEE International Solid- State Circuits Conference - (ISSCC),
Tsai, Ming-Da ; Yang, Song-Yu ; Yu, Chi-Yao... - p. 176-178 , 2020
Link: https://doi.org/10.1109/..
 
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9

Wafer-level test path pattern recognition and test characte..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Cheng, Ken Chau-Cheung ; Li, Katherine Shu-Min ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://dl.acm.org/doi/1..
 
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10

Wafer-Level Test Path Pattern Recognition and Test Characte..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Cheng, Ken Chau-Cheung ; Shu-Min Li, Katherine ; Huang, Andrew Yi-Ann... - p. 1710-1711 , 2020
Link: https://doi.org/10.23919..
 
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11

Full metal case antenna Design and measurement:

, In: 2016 Progress in Electromagnetic Research Symposium (PIERS),
Tsai, Ming-jhih ; Sun, Jwo-Shiun ; Chen, Guan-Yu - p. 430-430 , 2016
Link: https://doi.org/10.1109/..
 
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12

C++OpenCL4TVM: Support C++OpenCL Kernel for TVM NN Operator:

, In: International Workshop on OpenCL,
Chang, Po-Yao ; Chen, Tai-Liang ; Huang, Yu-Tse.. - p. 1-2 , 2022
Link: https://dl.acm.org/doi/1..
 
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13

The Support of MLIR HLS Adaptor for LLVM IR:

, In: Workshop Proceedings of the 51st International Conference on Parallel Processing,
Liang, Geng-Ming ; Yuan, Chuan-Yue ; Yu, Meng-Shiun... - p. 1-8 , 2022
Link: https://dl.acm.org/doi/1..
 
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14

Accelerating NNEF Framework on OpenCL Devices Using clDNN:

, In: Proceedings of the International Workshop on OpenCL,
Yu, Meng-Shiun ; Chen, Tai-Liang ; Lee, Jenq-Kuen - p. 1-2 , 2020
Link: https://dl.acm.org/doi/1..
 
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15

A Novel End-to-End Ensemble UNet Network Based on Edge Comp..:

, In: Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning,
Chen, Jianwen ; Tsai, Meng-Shiun ; Lin, Wan-Ju. - p. 403-408 , 2024
Link: https://dl.acm.org/doi/1..
 
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