I agree that this site is using cookies. You can find further informations here.
X
Yuan, Shushan
2  results:
Bookchapter (Online) X
Search for persons X
?
1

Critical Defect Detection at 3nm Technology Node: Enhanced ..:

, In: 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC),
Chiu, Shao-Chien ; Peng, Mark ; Wei, Yuan-Chung... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Simulation analysis of the interception effectiveness of AT..:

, In: 2023 IEEE 3rd International Conference on Electronic Technology, Communication and Information (ICETCI),
Weichen, Li ; Shushan, Wang ; Liyuan, Qiu.. - p. 1007-1015 , 2023
Link: https://doi.org/10.1109/..
 
1-2