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Yun Tian, Gui
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1

Comparison on pipeline welds and integrity through differen..:

, In: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Ma, Qiu Ping ; Yun Tian, Gui ; Gao, Bin... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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2

Imaging-based NDT Methods for Electronic Devices:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
Li, Kongjing ; Yun Tian, Gui ; Wang, Yangang - p. 53-58 , 2019
Link: https://doi.org/10.1109/..
 
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3

Novel Approach for Battery State of Charge Evaluation throu..:

, In: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC),
Bourelly, Carmine ; Milano, Filippo ; Ferrigno, Luigi.. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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4

An End-to-End Infrared and Visual Fusion Detection Framewor..:

, In: 2023 IEEE Far East NDT New Technology & Application Forum (FENDT),
Li, Jiacheng ; Gao, Bin ; Xu, Jieyi... - p. 199-202 , 2023
Link: https://doi.org/10.1109/..
 
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5

Circumferential and Longitudinal Defect Detection Using Mul..:

, In: 2021 IEEE Far East NDT New Technology & Application Forum (FENDT),
Ru, Gaige ; Gao, Bin ; Jiao, Daokun... - p. 140-144 , 2021
Link: https://doi.org/10.1109/..
 
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6

An Intrusion Detection System Against DDoS Attacks in IoT N..:

, In: 2020 10th Annual Computing and Communication Workshop and Conference (CCWC),
Roopak, Monika ; Tian, Gui Yun ; Chambers, Jonathon - p. 0562-0567 , 2020
Link: https://doi.org/10.1109/..
 
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7

Novel Yoke Structured Electromagnetic Thermography for Insp..:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
Liu, Zewei ; Gao, Bin ; Wu, Yingchun. - p. 134-137 , 2019
Link: https://doi.org/10.1109/..
 
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8

Complexed Shape Micro Defects Inspection By High Sensitivit..:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
Ma, Qiu Ping ; Gao, Bin ; Tian, Gui Yun.. - p. 110-114 , 2019
Link: https://doi.org/10.1109/..
 
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9

Mechanism Hybrid EMAT and Eddy Current Sensing Detection fo..:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
Guo, Wei ; Gao, Bin ; Tian, Gui Yun... - p. 138-142 , 2019
Link: https://doi.org/10.1109/..
 
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10

Wavelet Domain Based Defect Detection using Optical Thermog..:

, In: Proceedings of the 2019 International Conference on Intelligent Medicine and Image Processing,
Ahmed, Junaid ; Baloch, Gulsher Ali ; Tian, Gui Yun - p. 83-87 , 2019
Link: https://dl.acm.org/doi/1..
 
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11

Deep Adversarial Network for CFRP Thermal Imaging Debond Di..:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
Ruan, Ling-Feng ; Gao, Bin ; Wu, Shi-Chun. - p. 130-133 , 2019
Link: https://doi.org/10.1109/..
 
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12

Ensemble Tensor Factorization for Background Subtraction in..:

, In: 2019 Far East NDT New Technology & Application Forum (FENDT),
SONG, Jun-ru ; GAO, Bin ; TIAN, Gui-Yun - p. 115-119 , 2019
Link: https://doi.org/10.1109/..
 
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13

High reliable unilateral inductive axle counting sensor sys..:

, In: 2016 IEEE Far East NDT New Technology & Application Forum (FENDT),
Yang, Jin ; Tian, Gui-yun ; Gao, Yun-lai - p. 227-231 , 2016
Link: https://doi.org/10.1109/..
 
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14

Contributors:

, In: Fundamentals of Aluminium Metallurgy,
Dargusch, Matthew ; Donahue, Raymond J. ; Dorin, Thomas... - p. xv , 2018
Link: https://doi.org/10.1016/..
 
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15

Transfer Learning-Based Radio Frequency Fingerprint Identif..:

, In: GLOBECOM 2022 - 2022 IEEE Global Communications Conference,
Tian, Tao ; Wang, Yu ; Dong, Heng... - p. 4722-4727 , 2022
Link: https://doi.org/10.1109/..
 
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