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Zanoni, Enrico
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1

Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Saro, Marco ; de Pieri, Francesco ; Carlotto, Andrea... - p. 5B.2-1-5B.2-8 , 2024
Link: https://doi.org/10.1109/..
 
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2

Modeling the electrical characteristic and degradation mech..:

, In: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),
Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo... - p. 81-83 , 2023
Link: https://doi.org/10.1109/..
 
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3

Solid State Lighting for horticolture: impact of LED reliab..:

, In: 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18),
Trivellin, Nicola ; Buffolo, Matteo ; Caria, Alessandro... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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4

On the importance of Fast and Accurate LED Optical and Ther..:

, In: 2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC),
Trivellin, Nicola ; Roccato, Nicola ; Piva, Francesco... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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5

Optoelectronic technologies for lighting in automotive: sta..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Trivellin, Nicola ; Buffolo, Matteo ; De Santi, Carlo... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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6

A Review of SiC Commercial Devices for Automotive: Properti..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Marcuzzi, Alberto ; Favero, Davide ; Santi, Carlo De... - p. 1-6 , 2023
Link: https://doi.org/10.23919..
 
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7

Trapping in $\text{Al}_{2}\mathrm{O}_{3}/\text{GaN}$ MOScap..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Fregolent, Manuel ; Marcuzzi, Alberto ; De Santi, Carlo... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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8

Thermally-activated failure mechanisms of 0.25 \ \mu \mathr..:

, In: 2023 IEEE International Reliability Physics Symposium (IRPS),
Gao, Zhan ; Chiocchetta, Francesca ; Rampazzo, Fabiana... - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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9

GaN-Based Lateral and Vertical Devices:

, In: Springer Handbook of Semiconductor Devices; Springer Handbooks,
Meneghini, Matteo ; Chowdhury, Srabanti ; Derluyn, Joff... - p. 525-578 , 2022
Link: https://doi.org/10.1007/..
 
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10

Detrapping Kinetics in N-polar AlGaN/GaN MIS-HEMTs:

, In: 2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA),
Chiocchetta, Francesca ; Calascione, Claudia ; De Santi, Carlo... - p. 90-94 , 2021
Link: https://doi.org/10.1109/..
 
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11

Demonstration of Bilayer Gate Insulator for Improved Reliab..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Mukherjee, Kalparupa ; De Santi, Carlo ; Meneghesso, Gaudenzio... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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12

Reliability Physics of GaN HEMT Microwave Devices: The Age ..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Zanoni, Enrico ; Meneghini, Matteo ; Meneghesso, Gaudenzio... - p. 1-10 , 2020
Link: https://doi.org/10.1109/..
 
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13

Trap Dynamics Model Explaining the RON Stress/Recovery Beha..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Zagni, Nicolo ; Chini, Alessandro ; Puglisi, Francesco Maria... - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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14

Short Term Reliability and Robustness of ultra-thin barrier..:

, In: 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Gao, Zhan. ; Meneghini, Matteo. ; Harrouche, Kathia... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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15

Reliability of Ultraviolet Light-Emitting Diodes:

, In: Light-Emitting Diodes; Solid State Lighting Technology and Application Series,
De Santi, Carlo ; Monti, Desiree ; Dalapati, Pradip... - p. 397-424 , 2019
Link: https://doi.org/10.1007/..
 
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