Search for persons
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:
, In:
?
2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) ,
2
Modeling the electrical characteristic and degradation mech..:
, In:
?
2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18) ,
3
Solid State Lighting for horticolture: impact of LED reliab..:
, In:
?
2023 29th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) ,
4
On the importance of Fast and Accurate LED Optical and Ther..:
, In:
?
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
5
Optoelectronic technologies for lighting in automotive: sta..:
, In:
?
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
6
A Review of SiC Commercial Devices for Automotive: Properti..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
7
Trapping in $\text{Al}_{2}\mathrm{O}_{3}/\text{GaN}$ MOScap..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
8
Thermally-activated failure mechanisms of 0.25 \ \mu \mathr..:
, In:
?
Springer Handbook of Semiconductor Devices; Springer Handbooks ,
9
GaN-Based Lateral and Vertical Devices:
, In:
?
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) ,
10
Detrapping Kinetics in N-polar AlGaN/GaN MIS-HEMTs:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
11
Demonstration of Bilayer Gate Insulator for Improved Reliab..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
12
Reliability Physics of GaN HEMT Microwave Devices: The Age ..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
13
Trap Dynamics Model Explaining the RON Stress/Recovery Beha..:
, In:
?
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ,
14
Short Term Reliability and Robustness of ultra-thin barrier..:
, In:
?
Light-Emitting Diodes; Solid State Lighting Technology and Application Series ,
15