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2024 IEEE International Reliability Physics Symposium (IRPS) ,
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DC Reliability Study of $\text{high}-\kappa$ GaN-on-Si MOS-..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Side and Corner Region Non-Uniformities in Grown SiO2 and T..:
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2023 International Electron Devices Meeting (IEDM) ,
3
Backside Power Delivery: Game Changer and Key Enabler of Ad..:
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49th European Conference on Optical Communications (ECOC 2023) ,
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Accelerated dark current degradation study of monolithicall..:
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2023 International Electron Devices Meeting (IEDM) ,
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High Performance mm Wave AlN/GaN MISHEMTs on 200 mm Si Subs..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
6
Trap-polarization interaction during low-field trap charact..:
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2022 IEEE International Reliability Physics Symposium (IRPS) ,
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Modelling ultra-fast threshold voltage instabilities in Hf-..:
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2022 International Electron Devices Meeting (IEDM) ,
8
III-V/III-N technologies for next generation high-capacity ..:
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2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) ,
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Scaled FinFETs Connected by Using Both Wafer Sides for Rout..:
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2022 International Electron Devices Meeting (IEDM) ,
10
Insights into Scaled Logic Devices Connected from Both Wafe..:
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2021 IEEE International Reliability Physics Symposium (IRPS) ,
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CV Stretch-Out Correction after Bias Temperature Stress: Wo..:
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2021 IEEE International Memory Workshop (IMW) ,
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STT-MRAM array performance improvement through optimization..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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The Mysterious Bipolar Bias Temperature Stress from the Per..:
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2019 IEEE International Electron Devices Meeting (IEDM) ,
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Impact of Charge trapping on Imprint and its Recovery in Hf..:
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2019 IEEE International Integrated Reliability Workshop (IIRW) ,
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