Search for persons
X
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Scaling Trends and Bias Dependence of SRAM SER from 16-nm t..:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Total-Ionizing Dose Damage from X-Ray PCB Inspection System:
, In:
?
2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
Single-Event Performance of Flip Flop Designs at the 5-nm B..:
, In:
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
4
Effects of Collected Charge and Drain Area on SE Response o..:
, In:
?
2022 IEEE International Reliability Physics Symposium (IRPS) ,
6
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFE..:
, In:
?
2022 IEEE International Reliability Physics Symposium (IRPS) ,
8
Single-Event Latchup Vulnerability at the 7-nm FinFET Node:
, In:
?
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
9
Fault Propagation in Microprocessors with Configurable Cach..:
, In:
?
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS) ,
10
Micro-Latchup Location and Temperature Characterization in ..:
, In:
?
2021 IEEE International Reliability Physics Symposium (IRPS) ,
11
Frequency, LET, and Supply Voltage Dependence of Logic Soft..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
13
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Nod:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
14
Temperature Dependence of Single-Event Transient Pulse Widt..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
15